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Deep learning super sampling. Deep learning super sampling ( DLSS) is a family of real-time deep learning image enhancement and upscaling technologies developed by Nvidia that are exclusive to its RTX line of graphics cards, [ 1] and available in a number of video games. The goal of these technologies is to allow the majority of the graphics ...
LINPACK benchmarks. The LINPACK Benchmarks are a measure of a system's floating-point computing power. Introduced by Jack Dongarra, they measure how fast a computer solves a dense n by n system of linear equations Ax = b, which is a common task in engineering . The latest version of these benchmarks is used to build the TOP500 list, ranking the ...
Nvidia offers nForce4 chipset driver downloads for NT-based Windows versions from 2000 up to and including Vista in the "Legacy" product type category on their download page. However, there is no official support for Windows 7 or newer, but Windows 7 has a built-in driver for the nForce 6 chipset, which is very similar.
A Pattern-Based Software Testing Framework for Exploitability Evaluation of Metadata Corruption Vulnerabilities developed by Deng Fenglei, Wang Jian, Zhang Bin, Feng Chao, Jiang Zhiyuan, Su Yunfei discuss how there is increased attention in software quality assurance and protection.
Nvidia's shares traded at over $531 per share, and its market capitalization was valued at over US$328.7 billion in January 2021. [ 139] For the Q2 of 2020, Nvidia reported sales of $3.87 billion, which was a 50% rise from the same period in 2019. The surge in sales and people's higher demand for computer technology.
A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity, often to a breaking point, in order to observe the results. Reasons can include: to determine breaking points and ...
High-temperature operating life. High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested ...
A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity, often to a breaking point, in order to observe the results. Reasons can include: to determine breaking points and ...